TY  - RPRT
TI  - Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles
AU  - Hongjian Xia
AU  - Yi Zhang
AU  - Dao Zhou
AU  - Minyou Chen
AU  - Wei Lai
AU  - Yunhai Wei
AU  - Huai Wang
PY  - 2022
UR  - https://arxiv.org/abs/2208.13019
ID  - 2208.13019
ER  -