@misc{indiciae788726e6ccfc,
  title = {Deep Open-Set Recognition for Silicon Wafer Production Monitoring},
  author = {Luca Frittoli and Diego Carrera and Beatrice Rossi and Pasqualina Fragneto and Giacomo Boracchi},
  year = {2022},
  doi = {10.1016/j.patcog.2021.108488},
  url = {https://arxiv.org/abs/2208.14071},
  note = {Source identifier: 2208.14071}
}