@misc{indiciae5d0357e08ab1,
  title = {Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise},
  author = {Bekari Gabritchidze and Kieran A. Cleary and Anthony C. Readhead and Austin J. Minnich},
  year = {2024},
  doi = {10.1109/ted.2024.3445889},
  url = {https://arxiv.org/abs/2209.02858},
  note = {Source identifier: 2209.02858}
}