TY  - RPRT
TI  - Experimental Investigation of Drain Noise in High Electron Mobility Transistors: Thermal and Hot Electron Noise
AU  - Bekari Gabritchidze
AU  - Kieran A. Cleary
AU  - Anthony C. Readhead
AU  - Austin J. Minnich
PY  - 2024
DO  - 10.1109/ted.2024.3445889
UR  - https://arxiv.org/abs/2209.02858
ID  - 2209.02858
ER  -