@misc{indiciaea23b1f89380d,
  title = {Asymmetrical contact scaling and measurements in MoS2 FETs},
  author = {Zhihui Cheng and Jonathan Backman and Huairuo Zhang and Hattan Abuzaid and Guoqing Li and Yifei Yu and Linyou Cao and Albert V. Davydov and Mathieu Luisier and Curt A. Richter and Aaron D. Franklin},
  year = {2022},
  url = {https://arxiv.org/abs/2209.04144},
  note = {Source identifier: 2209.04144}
}