@misc{indiciaeacd66d4038c3,
  title = {SMART: Investigating the Impact of Threshold Voltage Suppression in an In-SRAM Multiplication/Accumulation Accelerator for Accuracy Improvement in 65 nm CMOS Technology},
  author = {Saeed Seyedfaraji and Baset Mesgari and Semeen Rehman},
  year = {2022},
  doi = {10.1109/dsd57027.2022.00115},
  url = {https://arxiv.org/abs/2209.04434},
  note = {Source identifier: 2209.04434}
}