TY  - RPRT
TI  - SMART: Investigating the Impact of Threshold Voltage Suppression in an In-SRAM Multiplication/Accumulation Accelerator for Accuracy Improvement in 65 nm CMOS Technology
AU  - Saeed Seyedfaraji
AU  - Baset Mesgari
AU  - Semeen Rehman
PY  - 2022
DO  - 10.1109/dsd57027.2022.00115
UR  - https://arxiv.org/abs/2209.04434
ID  - 2209.04434
ER  -