@misc{indiciae61ad20696f57,
  title = {A simple KPFM-based approach for electrostatic-free topographic measurements: the case of MoS\$\_2\$ on SiO\$\_2\$},
  author = {Aloïs Arrighi and Nathan Ullberg and Vincent Derycke and Benjamin Grévin},
  year = {2022},
  doi = {10.1088/1361-6528/acbe02},
  url = {https://arxiv.org/abs/2209.07925},
  note = {Source identifier: 2209.07925}
}