TY  - RPRT
TI  - A simple KPFM-based approach for electrostatic-free topographic measurements: the case of MoS$_2$ on SiO$_2$
AU  - Aloïs Arrighi
AU  - Nathan Ullberg
AU  - Vincent Derycke
AU  - Benjamin Grévin
PY  - 2022
DO  - 10.1088/1361-6528/acbe02
UR  - https://arxiv.org/abs/2209.07925
ID  - 2209.07925
ER  -