@misc{indiciaec8a0782be5a5,
  title = {A novel approach for wafer defect pattern classification based on topological data analysis},
  author = {Seungchan Ko and Dowan Koo},
  year = {2022},
  url = {https://arxiv.org/abs/2209.08945},
  note = {Source identifier: 2209.08945}
}