TY  - RPRT
TI  - Criticality-Based Quantum Metrology in the Presence of Decoherence
AU  - Wan-Ting He
AU  - Cong-Wei Lu
AU  - Yi-Xuan Yao
AU  - Hai-Yuan Zhu
AU  - Qing Ai
PY  - 2022
DO  - 10.1007/s11467-023-1278-2
UR  - https://arxiv.org/abs/2209.10731
ID  - 2209.10731
ER  -