@misc{indiciae01d76fdb6e88,
  title = {Electronic Origin of High-Tc Maximization and Persistence in Trilayer Cuprate Superconductors},
  author = {Xiangyu Luo and Hao Chen and Yinghao Li and Qiang Gao and Chaohui Yin and Hongtao Yan and Taimin Miao and Hailan Luo and Yingjie Shu and Yiwen Chen and Chengtian Lin and Shenjin Zhang and Zhimin Wang and Fengfeng Zhang and Feng Yang and Qinjun Peng and Guodong Liu and Lin Zhao and Zuyan Xu and Tao Xiang and X. J. Zhou},
  year = {2022},
  doi = {10.1038/s41567-023-02206-0},
  url = {https://arxiv.org/abs/2210.06348},
  note = {Source identifier: 2210.06348}
}