@misc{indiciaecaf93c09f74e,
  title = {Sensing Remote Bulk Defects Through Resistance Noise in a Large Area Graphene Field Effect Transistor},
  author = {Shubhadip Moulick and Rafiqul Alam and Atindra Nath Pal},
  year = {2022},
  url = {https://arxiv.org/abs/2210.09851},
  note = {Source identifier: 2210.09851}
}