TY  - RPRT
TI  - Sensing Remote Bulk Defects Through Resistance Noise in a Large Area Graphene Field Effect Transistor
AU  - Shubhadip Moulick
AU  - Rafiqul Alam
AU  - Atindra Nath Pal
PY  - 2022
UR  - https://arxiv.org/abs/2210.09851
ID  - 2210.09851
ER  -