TY  - RPRT
TI  - Role of the annealing parameters on the resistance of indium tin oxide nanocrystalline films
AU  - Fabio Marangi
AU  - Luigi Fenzi
AU  - Michele Bellingeri
AU  - Francesco Scotognella
PY  - 2023
DO  - 10.1016/j.optmat.2023.113860
UR  - https://arxiv.org/abs/2211.04144
ID  - 2211.04144
ER  -