@misc{indiciae2fd332fa3b01,
  title = {4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy},
  author = {Ettore Vittone and Paolo Olivero and Milko Jaksic and Zeljko Pastuovic},
  year = {2022},
  doi = {10.1016/j.nimb.2023.01.009},
  url = {https://arxiv.org/abs/2211.05740},
  note = {Source identifier: 2211.05740}
}