TY  - RPRT
TI  - 4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy
AU  - Ettore Vittone
AU  - Paolo Olivero
AU  - Milko Jaksic
AU  - Zeljko Pastuovic
PY  - 2022
DO  - 10.1016/j.nimb.2023.01.009
UR  - https://arxiv.org/abs/2211.05740
ID  - 2211.05740
ER  -