@misc{indiciaebda427519686,
  title = {In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam},
  author = {James O. Douglas and Michele Conroy and Finn Giuliani and Baptiste Gault},
  year = {2022},
  doi = {10.1093/micmic/ozad020},
  url = {https://arxiv.org/abs/2211.06877},
  note = {Source identifier: 2211.06877}
}