@misc{indiciaec2ac4a5b5153,
  title = {Thickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry},
  author = {Ralfy Kenaz and Saptarshi Ghosh and Pradheesh Ramachandran and Kenji Watanabe and Takashi Taniguchi and Hadar Steinberg and Ronen Rapaport},
  year = {2022},
  doi = {10.1021/acsnano.2c12773},
  url = {https://arxiv.org/abs/2211.07437},
  note = {Source identifier: 2211.07437}
}