TY  - RPRT
TI  - Thickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry
AU  - Ralfy Kenaz
AU  - Saptarshi Ghosh
AU  - Pradheesh Ramachandran
AU  - Kenji Watanabe
AU  - Takashi Taniguchi
AU  - Hadar Steinberg
AU  - Ronen Rapaport
PY  - 2022
DO  - 10.1021/acsnano.2c12773
UR  - https://arxiv.org/abs/2211.07437
ID  - 2211.07437
ER  -