TY  - RPRT
TI  - ET-AL: Entropy-Targeted Active Learning for Bias Mitigation in Materials Data
AU  - Hengrui Zhang
AU  - Wei Wayne Chen
AU  - James M. Rondinelli
AU  - Wei Chen
PY  - 2023
DO  - 10.1063/5.0138913
UR  - https://arxiv.org/abs/2211.07881
ID  - 2211.07881
ER  -