TY  - RPRT
TI  - Decoupling the Roles of Defects/Impurities and Wrinkles in Thermal Conductivity of Wafer-scale hBN Films
AU  - Kousik Bera
AU  - Dipankar Chugh
AU  - Aditya Bandopadhyay
AU  - Hark Hoe Tan
AU  - Anushree Roy
AU  - Chennupati Jagadish
PY  - 2023
UR  - https://arxiv.org/abs/2211.08683
ID  - 2211.08683
ER  -