@misc{indiciae449faf56900f,
  title = {Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness},
  author = {Samuel S. H. Ng and Jeremiah Croshaw and Marcel Walter and Robert Wille and Robert Wolkow and Konrad Walus},
  year = {2023},
  url = {https://arxiv.org/abs/2211.08698},
  note = {Source identifier: 2211.08698}
}