TY  - RPRT
TI  - Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness
AU  - Samuel S. H. Ng
AU  - Jeremiah Croshaw
AU  - Marcel Walter
AU  - Robert Wille
AU  - Robert Wolkow
AU  - Konrad Walus
PY  - 2023
UR  - https://arxiv.org/abs/2211.08698
ID  - 2211.08698
ER  -