@misc{indiciae00567487b67d,
  title = {Measurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers},
  author = {Jingwei Li and Ruixuan Wang and Lutong Cai and Qing Li},
  year = {2022},
  url = {https://arxiv.org/abs/2211.09220},
  note = {Source identifier: 2211.09220}
}