TY  - RPRT
TI  - Measurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers
AU  - Jingwei Li
AU  - Ruixuan Wang
AU  - Lutong Cai
AU  - Qing Li
PY  - 2022
UR  - https://arxiv.org/abs/2211.09220
ID  - 2211.09220
ER  -