TY  - RPRT
TI  - Purity decay rate in random circuits with different configurations of gates
AU  - Jaš Bensa
AU  - Marko Žnidarič
PY  - 2023
DO  - 10.1103/physreva.107.022604
UR  - https://arxiv.org/abs/2211.13565
ID  - 2211.13565
ER  -