TY  - RPRT
TI  - Quantitative 3D mapping of chemical defects at charged grain boundaries in a ferroelectric oxide
AU  - K. A. Hunnestad
AU  - J. Schultheiß
AU  - A. C. Mathisen
AU  - I. Ushakov
AU  - C. Hatzoglou
AU  - A. T. J. van Helvoort
AU  - D. Meier
PY  - 2023
UR  - https://arxiv.org/abs/2212.07924
ID  - 2212.07924
ER  -