TY  - RPRT
TI  - Rethinking Precision of Pseudo Label: Test-Time Adaptation via Complementary Learning
AU  - Jiayi Han
AU  - Longbin Zeng
AU  - Liang Du
AU  - Weiyang Ding
AU  - Jianfeng Feng
PY  - 2023
DO  - 10.1016/j.patrec.2023.12.001
UR  - https://arxiv.org/abs/2301.06013
ID  - 2301.06013
ER  -