@misc{indiciaedf45cd2b0bac,
  title = {Understanding the Frequency Dependence of Capacitance Measurements of Irradiated Silicon Detectors},
  author = {Sven Mägdefessel and Riccardo Mori and Niels Sorgenfrei and Ulrich Parzefall},
  year = {2023},
  url = {https://arxiv.org/abs/2301.09371},
  note = {Source identifier: 2301.09371}
}