TY  - RPRT
TI  - Understanding the Frequency Dependence of Capacitance Measurements of Irradiated Silicon Detectors
AU  - Sven Mägdefessel
AU  - Riccardo Mori
AU  - Niels Sorgenfrei
AU  - Ulrich Parzefall
PY  - 2023
UR  - https://arxiv.org/abs/2301.09371
ID  - 2301.09371
ER  -