@misc{indiciae31ad4687a0bc,
  title = {Learning Trustworthy Model from Noisy Labels based on Rough Set for Surface Defect Detection},
  author = {Tongzhi Niu and Bin Li and Kai Li and Yufeng Lin and Yuwei Li and Weifeng Li and Zhenrong Wang},
  year = {2023},
  url = {https://arxiv.org/abs/2301.10441},
  note = {Source identifier: 2301.10441}
}