TY  - RPRT
TI  - Learning Trustworthy Model from Noisy Labels based on Rough Set for Surface Defect Detection
AU  - Tongzhi Niu
AU  - Bin Li
AU  - Kai Li
AU  - Yufeng Lin
AU  - Yuwei Li
AU  - Weifeng Li
AU  - Zhenrong Wang
PY  - 2023
UR  - https://arxiv.org/abs/2301.10441
ID  - 2301.10441
ER  -