@misc{indiciaed6599bd531dd,
  title = {Joint data rate and EMF exposure analysis in Manhattan environments: stochastic geometry and ray tracing approaches},
  author = {Charles Wiame and Simon Demey and Luc Vandendorpe and Philippe De Doncker and Claude Oestges},
  year = {2023},
  url = {https://arxiv.org/abs/2301.11097},
  note = {Source identifier: 2301.11097}
}