TY  - RPRT
TI  - Joint data rate and EMF exposure analysis in Manhattan environments: stochastic geometry and ray tracing approaches
AU  - Charles Wiame
AU  - Simon Demey
AU  - Luc Vandendorpe
AU  - Philippe De Doncker
AU  - Claude Oestges
PY  - 2023
UR  - https://arxiv.org/abs/2301.11097
ID  - 2301.11097
ER  -