TY  - RPRT
TI  - Measuring spatially-resolved potential drops at semiconductor hetero-interfaces using 4D-STEM
AU  - Varun Shankar Chejarla
AU  - Shamail Ahmed
AU  - Jürgen Belz
AU  - Jonas Scheunert
AU  - Andreas Beyer
AU  - Kerstin Volz
PY  - 2023
UR  - https://arxiv.org/abs/2301.11179
ID  - 2301.11179
ER  -