TY  - RPRT
TI  - Life cycle models and security threats to a microcircuit during its development and operation
AU  - D. S. Belyakov
AU  - E. O. Kalinin
AU  - A. A. Konev
AU  - A. A. Shelupanov
AU  - A. K. Novokhrestov
PY  - 2023
UR  - https://arxiv.org/abs/2301.12740
ID  - 2301.12740
ER  -