TY  - RPRT
TI  - Planar defects as a way to account for explicit anharmonicity in high temperature thermodynamic properties of silicon
AU  - M. V. Kondrin
AU  - Y. B. Lebed
AU  - V. V. Brazhkin
PY  - 2023
DO  - 10.1134/s1063776123090091
UR  - https://arxiv.org/abs/2301.12745
ID  - 2301.12745
ER  -