TY  - RPRT
TI  - Impact of Surface Roughness in Measuring Optoelectronic Characteristics of Thin-Film Solar Cells
AU  - David Magginetti
AU  - Seokmin Jeon
AU  - Yohan Yoon
AU  - Ashif Choudhury
AU  - Ashraful Mamun
AU  - Yang Qian
AU  - Jordan Gerton
AU  - Heayoung Yoon
PY  - 2023
DO  - 10.1109/pvsc48320.2023.10359832
UR  - https://arxiv.org/abs/2302.00613
ID  - 2302.00613
ER  -