@misc{indiciae7781a3dacadf,
  title = {High-Resolution Short-Circuit Fault Localization in a Multi-Layer Integrated Circuit using a Quantum Diamond Microscope},
  author = {P. Kehayias and J. Walraven and A. L. Rodarte and A. M. Mounce},
  year = {2023},
  doi = {10.1103/physrevapplied.20.014036},
  url = {https://arxiv.org/abs/2302.01309},
  note = {Source identifier: 2302.01309}
}