TY  - RPRT
TI  - High-Resolution Short-Circuit Fault Localization in a Multi-Layer Integrated Circuit using a Quantum Diamond Microscope
AU  - P. Kehayias
AU  - J. Walraven
AU  - A. L. Rodarte
AU  - A. M. Mounce
PY  - 2023
DO  - 10.1103/physrevapplied.20.014036
UR  - https://arxiv.org/abs/2302.01309
ID  - 2302.01309
ER  -