@misc{indiciae5058bcb90354,
  title = {Moiré Fringes in Conductive Atomic Force Microscopy},
  author = {L. Richarz and J. He and U. Ludacka and E. Bourret and Z. Yan and A. T. J. van Helvoort and D. Meier},
  year = {2023},
  doi = {10.1063/5.0145173},
  url = {https://arxiv.org/abs/2302.01671},
  note = {Source identifier: 2302.01671}
}