@misc{indiciaecf7f6c621129,
  title = {Understanding metric-related pitfalls in image analysis validation},
  author = {Annika Reinke and Minu D. Tizabi and Michael Baumgartner and Matthias Eisenmann and Doreen Heckmann-Nötzel and A. Emre Kavur and Tim Rädsch and Carole H. Sudre and Laura Acion and Michela Antonelli and Tal Arbel and Spyridon Bakas and Arriel Benis and Matthew Blaschko and Florian Buettner and M. Jorge Cardoso and Veronika Cheplygina and Jianxu Chen and Evangelia Christodoulou and Beth A. Cimini and Gary S. Collins and Keyvan Farahani and Luciana Ferrer and Adrian Galdran and Bram van Ginneken and Ben Glocker and Patrick Godau and Robert Haase and Daniel A. Hashimoto and Michael M. Hoffman and Merel Huisman and Fabian Isensee and Pierre Jannin and Charles E. Kahn and Dagmar Kainmueller and Bernhard Kainz and Alexandros Karargyris and Alan Karthikesalingam and Hannes Kenngott and Jens Kleesiek and Florian Kofler and Thijs Kooi and Annette Kopp-Schneider and Michal Kozubek and Anna Kreshuk and Tahsin Kurc and Bennett A. Landman and Geert Litjens and Amin Madani and Klaus Maier-Hein and Anne L. Martel and Peter Mattson and Erik Meijering and Bjoern Menze and Karel G. M. Moons and Henning Müller and Brennan Nichyporuk and Felix Nickel and Jens Petersen and Susanne M. Rafelski and Nasir Rajpoot and Mauricio Reyes and Michael A. Riegler and Nicola Rieke and Julio Saez-Rodriguez and Clara I. Sánchez and Shravya Shetty and Maarten van Smeden and Ronald M. Summers and Abdel A. Taha and Aleksei Tiulpin and Sotirios A. Tsaftaris and Ben Van Calster and Gaël Varoquaux and Manuel Wiesenfarth and Ziv R. Yaniv and Paul F. Jäger and Lena Maier-Hein},
  year = {2024},
  doi = {10.1038/s41592-023-02150-0},
  url = {https://arxiv.org/abs/2302.01790},
  note = {Source identifier: 2302.01790}
}