@misc{indiciae10e054dc7ba0,
  title = {Industrial computed tomography based intelligent non-destructive testing method for power capacitor},
  author = {Zhenxing Cheng and Peng Wang and Yue Liu and Wei Qin and Zidi Tang},
  year = {2023},
  url = {https://arxiv.org/abs/2302.03601},
  note = {Source identifier: 2302.03601}
}