@misc{indiciaefc5d54e2251f,
  title = {Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping},
  author = {Joan Sendra and Fabian Haake and Micha Calvo and Henning Galinski and Ralph Spolenak},
  year = {2023},
  doi = {10.1002/adfm.202302179},
  url = {https://arxiv.org/abs/2302.04095},
  note = {Source identifier: 2302.04095}
}