TY  - RPRT
TI  - Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping
AU  - Joan Sendra
AU  - Fabian Haake
AU  - Micha Calvo
AU  - Henning Galinski
AU  - Ralph Spolenak
PY  - 2023
DO  - 10.1002/adfm.202302179
UR  - https://arxiv.org/abs/2302.04095
ID  - 2302.04095
ER  -