TY  - RPRT
TI  - BLAST: A Wafer-scale Transfer Process for Heterogeneous Integration of Optics and Electronics
AU  - Yanxin Ji
AU  - Alejandro J. Cortese
AU  - Conrad L. Smart
AU  - Alyosha C. Molnar
AU  - Paul L. McEuen
PY  - 2023
DO  - 10.1002/aelm.202300438
UR  - https://arxiv.org/abs/2302.05801
ID  - 2302.05801
ER  -