TY  - RPRT
TI  - Thermalization Effect in semiconductor Si, and metallic silicide NiSi2, CoSi2 by using Non-Adiabatic Molecular Dynamics Approach
AU  - Kun Luo
AU  - Weizhuo Gan
AU  - Zhaozhao Hou
AU  - Guohui Zhan
AU  - Lijun Xu
AU  - Jiangtao Liu
AU  - Ye Lu
AU  - Zhenhua Wu
PY  - 2023
UR  - https://arxiv.org/abs/2302.07434
ID  - 2302.07434
ER  -