@misc{indiciae1e1a22a582b3,
  title = {Optimizing YOLOv7 for Semiconductor Defect Detection},
  author = {Enrique Dehaerne and Bappaditya Dey and Sandip Halder and Stefan De Gendt},
  year = {2023},
  doi = {10.1117/12.2657564},
  url = {https://arxiv.org/abs/2302.09565},
  note = {Source identifier: 2302.09565}
}