TY  - RPRT
TI  - Optimizing YOLOv7 for Semiconductor Defect Detection
AU  - Enrique Dehaerne
AU  - Bappaditya Dey
AU  - Sandip Halder
AU  - Stefan De Gendt
PY  - 2023
DO  - 10.1117/12.2657564
UR  - https://arxiv.org/abs/2302.09565
ID  - 2302.09565
ER  -